Hioki BT3562A - Battery HiTester of Large Cells for xEVs or mid-Size Packs up of to 100 V

Hioki BT3562A - Battery HiTester of Large Cells for xEVs or mid-Size Packs up of to 100 V

Large cells for xEVs, Mid-sized packs of up to 100 V Voltage measurement ranges: 6 V/60 V/100 V Resistance measurement ranges: 3 mO/30 mO/300 mO/3 O/30 O/300 O/3 kO Simultaneous measurement of internal resistance and open circuit voltage. Equipped with LAN Hioki BT3562A Large cells for xEVs, Mid-sized packs of up to 100 VVoltage measurement ranges: 6 V/60 V/100 VResistance measurement ranges: 3 mO/30 mO/300 mO/3 O/30 O/300 O/3 kOSimultaneous measurement of internal resistance and open circuit voltage.Equipped with LAN Battery HiTester of large cells for xEVs or mid-size packs up of to 100 V Measuring battery performance and safety using internal resistance (AC-IR) and open-circuit voltage (OCV)Inspect the quality of completed cells, modules, and packs on production lines. Measure internal resistance (AC-IR) and open-circuit voltage (OCV) to check battery quality.Cells produced at the cell production factory are shipped to the module production factory after undergoing a shipping inspection. Since factors such as vibrations during shipment and even the passage of time can cause defects, batteries undergo an acceptance inspection before being assembled into modules and packs. Reducing test system development cost and management man-hours The new BT356xA has dramatically improved tolerances for line resistance compared to previous models. This improvement makes it easy to build test systems with large numbers of channels using relays. Additionally, a longer maintenance cycle for systems in use means fewer maintenance man-hours. Finally, its capability to handle thinner cables than with previous models* makes it easier to route cables.*AWG 29 (0.064 mm2) wire equivalent to 2.2 O over an 8 m round trip can be used with the 3 mO or 30 mO range. Improve Productivity by Increasing the Number of Inspection Channels You can use the Switch Mainframe SW1001/SW1002 to increase the number of measurement channels. Additionally, you can perform scan measurement by controlling two instruments at once, for example a BT356xA series instrument and a DM7276, or a BT4560 and a DM7276.